Babysitter fib-mill-controller

Focused Ion Beam milling skill for site-specific nanofabrication and cross-section preparation

install

source · Clone the upstream repo

git clone https://github.com/a5c-ai/babysitter

Claude Code · Install into ~/.claude/skills/

T=$(mktemp -d) && git clone --depth=1 https://github.com/a5c-ai/babysitter "$T" && mkdir -p ~/.claude/skills && cp -r "$T/library/specializations/domains/science/nanotechnology/skills/fib-mill-controller" ~/.claude/skills/a5c-ai-babysitter-fib-mill-controller && rm -rf "$T"

manifest: library/specializations/domains/science/nanotechnology/skills/fib-mill-controller/SKILL.md

FIB Mill Controller

Purpose

The FIB Mill Controller skill provides focused ion beam process control for site-specific nanofabrication and sample preparation, enabling precise material removal and deposition at the nanoscale.

Capabilities

TEM lamella preparation
Nanoscale milling and deposition
Pattern writing and editing
Cross-section imaging
Gas-assisted etching/deposition
Damage minimization protocols

Usage Guidelines

FIB Processing

TEM Lamella Preparation
- Deposit protective cap
- Rough mill with high current
- Fine polish to target thickness
Nanofabrication
- Define pattern geometry
- Optimize beam parameters
- Minimize gallium implantation
Circuit Editing
- Navigate to target location
- Selective material removal
- Metal deposition for reconnection

Process Integration

Nanodevice Integration Process Flow
Multi-Modal Nanomaterial Characterization Pipeline

Input Schema

{
  "operation": "lamella|milling|deposition|cross_section",
  "material": "string",
  "target_thickness": "number (nm, for lamella)",
  "pattern_file": "string (for milling)",
  "beam_voltage": "number (kV)"
}

Output Schema

{
  "process_parameters": {
    "beam_current": "number (pA)",
    "dwell_time": "number (us)",
    "overlap": "number (%)"
  },
  "milling_depth": "number (nm)",
  "lamella_thickness": "number (nm)",
  "damage_layer": "number (nm)",
  "processing_time": "number (minutes)"
}