Babysitter tof-sims-analyzer
Time-of-Flight Secondary Ion Mass Spectrometry skill for molecular surface analysis and imaging
install
source · Clone the upstream repo
git clone https://github.com/a5c-ai/babysitter
Claude Code · Install into ~/.claude/skills/
T=$(mktemp -d) && git clone --depth=1 https://github.com/a5c-ai/babysitter "$T" && mkdir -p ~/.claude/skills && cp -r "$T/library/specializations/domains/science/nanotechnology/skills/tof-sims-analyzer" ~/.claude/skills/a5c-ai-babysitter-tof-sims-analyzer && rm -rf "$T"
manifest:
library/specializations/domains/science/nanotechnology/skills/tof-sims-analyzer/SKILL.mdsource content
ToF-SIMS Analyzer
Purpose
The ToF-SIMS Analyzer skill provides molecular-level surface analysis capabilities for nanomaterials, enabling identification of surface species, chemical imaging, and depth profiling with high sensitivity.
Capabilities
- Molecular ion identification
- Surface contamination analysis
- 2D and 3D chemical imaging
- Isotope labeling detection
- Depth profiling
- Principal component analysis of spectra
Usage Guidelines
ToF-SIMS Analysis
-
Spectral Analysis
- Identify characteristic fragments
- Build peak lists for materials
- Apply multivariate analysis
-
Imaging Mode
- Optimize spatial resolution
- Generate chemical maps
- Correlate with topography
-
Depth Profiling
- Select appropriate sputter source
- Monitor interface sharpness
- Account for matrix effects
Process Integration
- Multi-Modal Nanomaterial Characterization Pipeline
- Nanomaterial Surface Functionalization Pipeline
Input Schema
{ "sample_id": "string", "analysis_mode": "spectral|imaging|depth_profile", "primary_ion": "Bi3+|Bi1+|C60+", "polarity": "positive|negative", "area_of_interest": {"x": "number", "y": "number"} }
Output Schema
{ "identified_species": [{ "mass": "number (amu)", "assignment": "string", "intensity": "number" }], "chemical_maps": [{ "species": "string", "image_path": "string" }], "pca_results": { "principal_components": "number", "variance_explained": ["number"] } }